Abstract
Photoconductivity decay data have been obtained for NH4F(aq)-etched Si(111) and for air-oxidized Si(111) surfaces in contact with solutions of methanol, tetrahydrofuran (THF), or acetonitrile containing either ferrocene+/0 (Fc+/0), [bis(pentamethylcyclopentadienyl)iron]+/0 (Me10Fc+/0), iodine (I2), or cobaltocene+/0 (CoCp2+/0). Carrier decay measurements were made under both low-level and high-level injection conditions using a contactless rf photoconductivity decay apparatus. When in contact with electrolyte solutions having either very positive (Fc+/0, I2/I-) or relatively negative (CoCp2+/0) Nernstian redox potentials with respect to the conduction-band edge of Si, Si surfaces exhibited low effective surface recombination velocities. In contrast, surfaces that were exposed only to N2(g) ambients or to electrolyte solutions that contained a mild oxidant (such as Me10Fc+/0) showed differing rf photoconductivity decay behavior depending on their different surface chemistry. Specifically, surfaces that pos...
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