Abstract
The current-phase relations in planar SNS and SIS junctions are calculated self-consistently using the quasiclassical theory. The model devised by Ovchinnikov and Culetto et al. for the rough surface is used to study the effects of interface scattering on the current-phase relation in SNS junctions and to mimic the insulator layer in SIS junctions. A weak coupling version of the quasiclassical theory is adopted in this paper for simplicity. Finally, the results of the current-phase relation at different roughness parameters and temperatures are presented and discussed.
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