Effects of interface number on the temperature and frequency dependence of the properties of Pb(Zr0.52Ti0.48)O3/Ba(Mg1/3Ta2/3)O3 thin films

Abstract

In this paper, PbZr0.52Ti0.48O3 (PZT) and Ba(Mg1/3Ta2/3)O3 (BMT) thin films were prepared by sol-gel method and aqueous solution-gel method, respectively. PZT/BMT thin films with different interface numbers were prepared and the effects of interface number on the temperature and frequency dependence of PZT/BMT thin films were investigated. The interface number can improve the temperature stability of PZT/BMT thin films in the 85 to 205°C range. As the temperature increases, there is an increase in the remanent polarization for the PZT/BMT thin films and the increasing rate of the remanent polarization decreases with the increase of interface number. As the frequency increases, the remanent polarization for the PZT/BMT thin films decreases and the decline rate of remanent polarization slows with the interface number increasing, indicating that interface number can improve the frequency stability of PZT/BMT thin films.