Abstract
The scaling of the current-voltage characteristics is examined theoretically using the flux-creep model with taking account of the effects of distributed flux- pinning strength and flux flow for thin-film high-temperature superconductors in the perpendicular magnetic field. It is found that the scaling is obtained also for the theoretical result from the flux-creep model. At the same time the obtained dynamic and static critical indices become close to experimental results by taking account of these two effects. A quantitative agreement is obtained also for the “transition” line in a Bi-2223 thin film. It is concluded that the mechanism of flux pinning, creep and flow explains the dynamic behavior of thermally activated flux lines. The reason why such a scaling is derived also from the mechanism of flux pinning, creep and flow is argued.
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