Abstract
The effects of dissolved hydrogen on the evolution and kinetics of interlayer reactions in polycrystalline Ni/Mg multilayer and Ni/Nb bilayer have been investigated by X-ray diffraction and Auger electron depth profiling. In the Ni/Mg multilayer, the reaction producing Mg 2Ni or β-Mg 2NiH 4 is retarded by hydrogenation at ≲373 K, whereas at ≳473 K it little influences the reaction rate. This is in contrast with Ni/Ti and Pd/Ti multilayers studied previously, where the interlayer reactions are completely suppressed by hydrogenation. On the other hand, in the Ni/Nb bilayer, the reaction producing Ni 3Nb is greatly enhanced by hydrogenation at ≳723 K compared with that without hydrogen which takes place only at ≳798 K. This enhanced reaction by hydrogenation may be related with superabundant thermal vacancies coexisting with dissolved hydrogen atoms in the Nb layer. The asymmetrical growth of Ni 3Nb toward the Nb layer is reasonably explained by the enhanced interdiffusion in this layer.
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