Abstract

Nowadays, compact and reliable electronic devices including up-to-date ceramic micro-electro-mechanical systems require thick-film resistors with significantly reduced dimensions and stable and precise resistance values. For that reason, instead of standard laser trimming method, high voltage pulse trimming of thick-film resistors is being introduced. This method allows controlled and reliable resistance adjustment regardless of resistor position or dimensions and without the presence of cuts. However, it causes irreversible structural changes in the pseudorandom network formed during sintering causing the changes in conducting mechanisms. In this paper results of the experimental investigation of high voltage pulse trimming of thick-film resistors are presented. Obtained results are analyzed and correlations between resistance and low-frequency noise changes and changes in conducting mechanisms in resistors due to high voltage pulse trimming are observed. Sources of measured fluctuations are identified and it is shown that this type of trimming is a valid alternative trimming method to the dominant laser trimming.

Highlights

  • Thick film resistors have been used for decades but due to their reliable performances they are still commonly used in both commercial and specialized electronics

  • This paper investigates effects of high voltage pulse trimming on structural properties of thick- film resistors from the aspect of random resistor network model

  • In this paper effects of high voltage pulse trimming on structural properties of thickfilm resistors are presented

Read more

Summary

Introduction

Thick film resistors have been used for decades but due to their reliable performances they are still commonly used in both commercial and specialized electronics. For years they have been used in sensitive telecommunications equipment and various sensing applications. When micro-electro-mechanical systems (MEMS) technology emerged, thick-film technology became useful alternative for micro-machining silicon. Extensive research of high-voltage pulse stressing of thick-film resistors [1,2,3,4,5,6] resulted in an alternative trimming method [7].

Objectives
Results
Conclusion
Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call