Effects of heavy ion radiation on digital micromirror device performance

Abstract

There is a pressing need in the astronomical community for space-suitable multiobject spectrometers (MOSs). Several digital micromirror device (DMD)-based prototype MOSs have been developed for ground-based observatories; however, their main use will come with deployment on a space-based mission. Therefore, the performance of DMDs under exoatmospheric radiation needs to be evaluated. DMDs were rewindowed with 2-μm thick pellicle and tested under accelerated heavy-ion radiation (control electronics shielded from radiation), with a focus on the detection of single-event effects (SEEs) including latch-up events. Testing showed that while DMDs are sensitive to nondestructive ion-induced state changes, all SEEs are cleared with a soft reset (i.e., sending a pattern to the device). The DMDs did not experience single-event induced permanent damage or functional changes that required a hard reset (power cycle), even at high ion fluences. This suggests that the SSE rate burden will be manageable for a DMD-based instrument when exposed to solar particle fluxes and cosmic rays in orbit.