Abstract
Effects of Heat-Treatment on the Population of Intrinsic Defects in and the Stability of an Amorphous Metal-Oxide Thin-Film Transistor
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
https://doi.org/10.1109/led.2023.3345356
Copy DOIJournal: IEEE Electron Device Letters | Publication Date: Feb 1, 2024 |
Effects of Heat-Treatment on the Population of Intrinsic Defects in and the Stability of an Amorphous Metal-Oxide Thin-Film Transistor
Join us for a 30 min session where you can share your feedback and ask us any queries you have