Abstract
(Sr1-xCax)S:Cu,F solid solution thin films were deposited by electron beam evaporation using solid solution phosphors as evaporation sources. The films were then annealed at 900°C in Ar or H2S by rapid thermal annealing (RTA). For the solid solution phosphors, we observed a shift of the X-ray diffraction (XRD) peaks toward higher values of 2θ as well as a shift of the PL peak position from 473 to 413 nm with an increase in x. For the solid solution thin films, although nearly the same change of XRD peaks as for the phosphors was observed, the change of PL spectra was different from that of the spectra for phosphors; in particular, a dependence of the spectra on the type of annealing atmosphere was found. The annealing of the films in H2S induced the formation of Cu+–Cu+ dimer centers with an emission peak at approximately 530 nm, in addition to the main peak due to the 1Eg→1A1g transition in Cu+ ions.
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