Abstract

The effects of excitation frequency (10 kHz–25 MHz) on plasma etching, voltage-current characteristics, emission spectra, and ion densities and energies in the sheath of chlorine plasmas, have been studied at 0.3 Torr using several techniques. Emission spectra and mass spectral analysis of ions extracted from the sheath region show a dramatic increase in the Cl+ signal as frequency is lowered through the ion–transit frequency near ∼1 MHz. Concurrently, the voltage at constant power and energy of ions impinging on the electrodes increase dramatically, while the etch rate of poly-Si increases due to ion-enhanced reactions. The Cl+2 ion density and degree of Cl2 dissociation to Cl atoms were found to be roughly frequency independent.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.