Abstract
The relationship between random errors in the resistive taper of a strip using physical optics and integral equation models is shown. Error and no-error terms are calculated for the resistivity, strip current density, and scattering patterns. It is shown that the integral equation and physical optics models produce very similar results. These models allow one to separate the error and no-error terms in the strip current density and the scattering patterns in order to study the effects of random and correlated errors in the resistive taper. >
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