Abstract
Nb-doped lead zirconate titanate (PNZT) perovskite films have been prepared on LaNiO3/SiO2/Si and Pt/Ti/SiO2/Si substrates using a sol–gel route. With the same Au top electrodes, the as-fabricated PNZT/LaNiO3 film exhibits better ferroelectric fatigue property than that of PNZT/Pt film. The results of ferroelectric imprint show that the net internal electric fields toward the top and bottom electrodes can be built in PNZT/LaNiO3 and PNZT/Pt films, respectively. Imprint failure of the PNZT film is found to be affected by the internal electric field, which could be explained by the barriers between the PNZT films and electrodes. The results indicate that the ferroelectric fatigue and imprint properties of PNZT film could be improved by introducing appropriate top and bottom electrodes.
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