Abstract

Titanium nitride (TiN) coatings were prepared on mild steel (MS) substrates by the direct current reactive magnetron sputtering. With the aim of improving the adhesion of TiN layer, an additional nickel interlayer was brush plated on the MS substrates before TiN coating formation. The phase has been identified with X-ray diffraction analysis and the results show that the prominent peaks observed in the diffraction patterns correspond to the (111), (200) and (222) planes of TiN. Cross-sectional SEM indicated the presence of columnar structure. The mechanical properties such as modulus and hardness of these films were characterised by the nanoindentation technique.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call