Abstract
The microstructural changes and phase decomposition at the surface of an ultra-precision machined Zn–Al based alloy were studied using optical microscopy, back-scattered electron microscopy, electron back-scattered diffraction and X-ray diffraction techniques. It was found that with increasing DoC the phase decomposition was accelerated and further increasing DoC might cause a microstructural recovery on the surface of the UPM specimen. UPM induced phase decomposition was discussed in relation to the structural evolution of the chips.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
