Abstract
Growth chamber tests were conducted on three lentil cultivars susceptible (Eston), moderately resistant (Laird), and resistant (Indianhead) to Ascochyta blight, caused by Ascochyta fabae f. sp. lentis. Leaf wetness after inoculation, temperature, and plant growth stage had significant effects on infection and disease development. The highest infection frequency occurred with a wetness period of 24 or 48 h. For all cultivars, latent periods were shortest (6-7 days) at 20 C and longest (13-14 days) at 10 C. Temperature had little effect on lesion size and number of pycnidia per lesion, but infection frequency was higher at 10 and 15 C than at 25 C. The lowest number of lesions and pycnidia and the smallest lesions occurred on Indianhead at 10, 15, and 20 C
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