Abstract
On the basis of a new formalism for the X-ray scattering from a crystal surface [J. Harada, Acta Cryst. A 48 (1992) 764] it is shown that if a crystal surface possesses some roughness, two kinds of effects are produced on the crystal truncation rod (CTR) scattering: the sharp CTR scattering reduces its intensity by a roughness damping factor (like a Debye-Waller factor), and diffuse scattering is generated. This is shown to be given by an intensity formula similar to that used for short-range-order diffuse scattering for a binary alloy system.
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