Abstract

ABSTRACTMercuric iodide (HgI2) single crystals deposited with transparent indium-tin-oxide (ITO), and semitransparent gold and nickel contacts were investigated by thermally stimulated current spectroscopy (TSC). The differences in the TSC spectra from these samples indicate that the defect structure in HgI2 may be modified by the contact material. These defects act as carrier traps and have strong implications in the application of HgI2 nuclear detectors. A method of numerical analysis was developed to extract information such as carrier trap activation energy, capture cross-section, and trap concentration-lifetime product from the TSC measurements.

Full Text

Published Version

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.