Abstract
An experimental study of thick film strain sensitive resistors as typically employed in resistive bridge interface circuits has been undertaken. It has been found that the chosen aspect ratio (length to width ratio) of these screen printed and fired thick film resistors has a significant effect on both the temperature coefficient of resistance and the low frequency noise characteristics of the devices. This sensitivity to aspect ratio has been attributed to metal end contact migration in the devices during firing and hence a relationship between the sensitivity and the choice of end contact material and the firing regime employed in device fabrication has also been identified.
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