Abstract
In article number 2000505, Efrat Lifshitz, Dima Cheskis and co-workers present a simple method aimed to reduce the density of clusters containing oxygen functional groups (oxygen debris) weakly bonded to the graphene oxide (GO) surface. The scanning tunneling microscopy (STM) image of untreated GO (left image on the cover) shows bright patterns superimposed onto the graphene atomically resolved structure. The randomly dispersed bright spots are most probably related to agglomeration of oxygen functional groups. The fast Fourier transform (FFT) (center image) of the STM image exhibits two different frequencies. The lower frequencies (central ring) are connected to the brighter and distorted regions, whereas the higher frequencies are characteristic of the hexagonal structure observed in graphenic regions. The right image is the inverse Fourier transform image considering only the higher frequencies.
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