Abstract
This paper aims to determine the effect of ZrO2 on the parameters of glass-based radiation shielding with the molecular formula xZrO2-(55-x)B2O3-15Bi2O3-10MgO-20PbO (mole fraction, x= 0, 4, 8, 12, and 16 mol%). The parameters tested include Mass Attenuation Coefficients (MAC), Linear Attenuation Coefficient (LAC), Half-Value Layer (HVL), Tenth-Value Layer (TVL), Mean Free Path (MFP), and Effective Atomic Number (Zeff), which are measured using the XCOM and Phy-X/PSD programs in the energy range between 0.015 MeV and 15 MeV. The MAC values obtained for all samples are between 0.0439-76.4100 cm2/g for 0ZrO, 0.0440-75.9300 cm2/g for 4ZrO, 0.0441-75.4700 cm2/g for 8ZrO, 0.0443-75.0200 cm2/g for 12ZrO, 0.0444-74.5800 cm2/g for 16ZrO. The difference in results between XCOM and Phy-X/PSD is very small, less than 0.1%. Compared with commercial shields such as RS-253-G18 glass shield and 40% synthetic borax radiation shield, ZrO2-based glass shield has better radiation capability. The 16ZrO sample has the best quality among all ZrO2-based glass shield samples at various radiation photon energies. This study is expected to be a reference in making glass radiation shields in further experiments. Keywords: Radiation Shielding, Zirconium Oxide, Bi2O3, XCOM, Phy-X/PSD, S
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