Abstract
Thin films of pure and zinc doped copper oxide have been grown on Si (1 0 0) substrate using pulsed laser deposition at varying concentrations of zinc. The effects of the doping concentration on structural, surface and optical properties of all thin films have been investigated. X-ray diffraction shows the presence of monoclinic CuO phase and compressive stresses in all thin films. The Raman spectra show an up-shift in the Raman peak position for doped thin films. Micrographs show smooth surface morphology, free from micron sized laser generated particulates. Spectroscopic el- lipsometry has been used to study the optical constants (w, D ,n , k,e1, e2). Optical bandgap energies have been calculated and found to be dependent on stresses in the films. Consequently, Zn doping induced stresses have strong effects on microstructure and optical properties of thin films.
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