Abstract

Tri Ethyl Ammonium Picrate (TEAP) and Yttrium (Y2+) ions doped single crystals were grown by slow evaporation technique at room temperature. The estimated band gap of the pure TEAP, 0.10 mol % and 0.15 mol % of Y2+ ions doped TEAP are 3.76 eV, 3.82 eV and 3.86 eV. Crystallite size of the grown materials was calculated from powder XRD as 1.456 nm for TEAP, 3.2028 nm for 0.10 mol % of Y2+ ions doped TEAP and 6.934 nm for 0.15 mol % of Y2+ ions doped TEAP single crystals. Y–O stretching mode was assigned by FTIR spectral peak at 549 cm−1. The PL excitation wavelength of the grown materials is 350 nm. The EDAX analysis confirmed by the Carbon, Nitrogen, Oxygen and Yttrium were presented in grown crystals.

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