Effect of various reduction methods of graphene oxide on electromagnetic shielding performance of reduced graphene oxide against electromagnetic pollution in X-band frequency

Abstract

A comparative study based on the effect of various novel reduction techniques for the fabrication of devices for electromagnetic interference (EMI) shielding in X-band frequency is reported. Among various reduction methods, we have used hydrazine hydrate and thermal annealing, low energy ion beam implantation and swift heavy ion irradiation. The synthesis as well as reduction of the samples is confirmed by the Raman spectra and FT-IR studies. The room temperature dc electrical conductivity is correlated with the extent of reduction of graphene oxide samples. The sample reduced with hydrazine hydrate and swift heavy ion irradiation of Ag+8 at 100MeV has highest dc electrical conductivity value, which leads to higher EMI shielding effectiveness of 55.29dB and skin depth of 0.0188cm. It is also observed that the skin depth decreases with increase in electrical conductivity. This suggests a strong potential of these samples for high performance EMI shielding applications.