Abstract
The vanadium distribution in multilayer ceramic capacitors (MLCCs), sintered under a reducing atmosphere, was investigated using scanning transmission electron microscopy–electron energy loss spectroscopy (STEM–EELS), and insulation resistance degradation was analyzed using impedance spectroscopy in highly accelerated lifetime tests to clarify the effects of vanadium on both the electrical properties and microstructure of MLCCs. Vanadium mitigated insulation resistance degradation and increased the reliability of MLCCs. Moreover, vanadium content increased and insulation resistance at the ceramic/electrode interface decreased slowly. This change in dynamics directly resulted in an improved lifetime of MLCCs. The results of STEM–EELS analysis showed that vanadium distributed along the grain boundary and grain boundary junction, but substituted into BaTiO3 at the ceramic/electrode interface. Therefore, it is considered that vanadium substitution at the ceramic/electrode interface improves the reliability of MLCCs.
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