Abstract
The influence of uniaxial stress on the electronic T13(F)→T23(F) transitions of Ni2+ (d8) in ZnO at 4216, 4240, and 4247cm−1 is studied. It is shown that the split pattern and polarized properties of IR absorption lines are consistent with a dynamic Jahn–Teller effect in the T23(F) state of the defect.
Published Version
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