Effect of uniaxial mechanical stress on Shubnikov-de Haas oscillations in hole channels of silicon field-effect transistors

Abstract

A study is made of the effect of uniaxial mechanical stress on Shubnikov-de Haas oscillations in two-dimensional hole channels of silicon field-effect transistors. It is shown that the main effect of the stress is a shift of the node of the beats of the oscillations. This shift corresponds in the case of compression (tension) to an increase (decrease) of the spin splitting in a zero magnetic field. In the case of two filled size-quantization subbands a mechanical stress of either sign causes a small fraction of the carriers to be transferred from the lower into the upper subband.