Abstract
The thermally induced redistribution of carriers between quantum well (QW) and quantum dot (QD) layers in a hybrid dot-well system composed of InAs QDs and an InGaAs QW is studied by means of photoluminescence (PL) spectroscopy. This redistribution significantly affects the QD and QW PL intensities depending both on the dot-well barrier thickness and height. For comparatively thin barriers, the interplay between tunnel and thermal carrier fluxes becomes crucial, governing the exciton dynamics in a tunnel injection dot-well structure at elevated temperatures. For a sufficiently thick spacer, it is shown that exciton localization within the QW, apparently induced by QD strain fields, has a profound influence on the transfer dynamics at low temperatures.
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