Abstract
Sensitivity of critical transistor parameters to halo implant tilt angle for 0.14-/spl mu/m CMOS devices was investigated. V/sub th/ sensitivity was found to be 3% per tilt degree. A tilt angle mismatch between two serial ion implanters used in manufacturing was detected by tracking V/sub th/ performance for 0.14-/spl mu/m production lots. Even though individual implanters may be within tool specifications for tilt angle control (/spl plusmn/0.5/spl deg/ for our specific tool type), the relative mismatch could be as large as 1/spl deg/, and therefore, result in a V/sub th/ mismatch of over 3% from nominal. The V/sub th/ mismatch results are in qualitative agreement with simulation results using SUPREM and MEDICI software.
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