Abstract
ABSTRACT ZnO films with and without Ti doping were deposited on the glass substrate by the spin coating method. Zn1-xTixO films have been investigated by the XRD, field emission scanning electron microscopy (FESEM), energy dispersive x- ray spectroscopy, UV-VIS spectroscopy and atomic force microscopy (AFM) analyses. FESEM images have shown that films surface morphology clearly altered with different Ti content. AFM measurements have shown that the root mean square roughness have increased from 6.18 nm to 12.3 nm by increasing Ti doping content. By increasing Ti concentration, the transparency of the ZnO films decreased while the optical band gap increased.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
