Effect of Ti Additions on Structure of In-situ Al∕Si FGMs by Electromagnetic Separation Method

Abstract

This paper investigated structure distribution of in‐situ Al/Si functionally graded materials (FGMs) by electromagnetic separation method. Results show that in Al‐25wt.%Si (hypereutectic) sample made by electromagnetic separation method, the microstructures change from Al‐Si hypereutectic structure to Al‐Si eutectic structure to Al‐Si hypoeutectic structure from one side of the sample to the other. But primary Si particles of hypereutectic structure zone (i.e. particle packed zone) tend to form larger particle clusters, which is adverse to fabricate in‐situ Al/Si FGMs with smooth gradient of primary Si particles. Adding Ti element to the sample can prevent primary Si particles from forming particle clusters and contribute to produce in‐situ Al/Si FGMs with smooth gradient.