Effect of thermal relaxation on residual stress and microstructure in the near-surface layers of dual shot peened Inconel 625

Abstract

Thermal relaxation behavior of residual stress and microstructure in the near-surface layers of dual shot peened Inconel alloy 625 was investigated by X-ray diffraction method. Residual stress on the top surface layer was significantly relaxed in the first 15 min at the elevated temperatures of 500°C, 600°C, and 700°C. However, there was still high maximum compressive residual stress in subsurface layers. The relaxation behavior of residual stress has contributed to the thermally activated process. The activation enthalpy Δ H and m were calculated according to the Zener–Wert–Avrami method, the values of which were 1.59 eV and 0.4934, respectively. Microstructural evaluation revealed that it was slightly changed in the near-surface layers after various isothermal treatments. Accordingly, high level of compressive residual stress and dislocation density resulted in the retained mechanical properties of dual shot peened Inconel 625, which was discussed based on the relaxation of microstructure and microhardness.