Abstract
The effect of thermal agitations on the switching field distribution (SFD) of CoPtCr–SiO2 perpendicular media was investigated. Dc demagnetizing (DCD) magnetization curves and minor dc demagnetizing (M-DCD) magnetization curves were measured at applied field sweep rates of ∼10 and ∼108Oe∕s. We estimated the SFD from the difference between the DCD and M-DCD curves, and defined them as ΔHr∕Hr (at ∼10Oe∕s) and ΔHrP∕HrP (at ∼108Oe∕s). The values of ΔHrP∕HrP were found to be 60%–70% of ΔHr∕Hr. The difference between ΔHrP∕HrP and ΔHr∕Hr should be caused by thermal agitation of the magnetization. The influence of the distribution of the thermal agitation on SFD was calculated using the distribution of the grain volumes. It is concluded that the SFD measured at vibrating-sample magnetometer (VSM) time scales is significantly influenced by thermal agitation of the magnetization, and reduction of the grain size distribution is the most effective way to reduce the SFD at VSM time scales.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
