Abstract

Optimum linearity, and maximum efficiency, for thin-amplitude and thin-phase holograms of small modulation depth are realized at different values of average exposure (bias). We utilize a threshold model for the photographic detection process to predict the bias values. These values are shown to be in agreement with available experimental results. For large modulation, the biasing point depends upon both modulation depth and average exposure.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call