Abstract
The dependence of the mode partition noise (MPN) and the power penalty associated with it can be measured from the source spectral width. Our findings show that there is strong dependence of the carrier lifetime on the bit error rate degradation caused by MPN on the spectral width of the vertical cavity surface emitting laser (VCSEL). VCSELs with smaller spectral width (shorter carrier lifetime) exhibited smaller MPN induced power penalty. We found that the theoretical calculation of the power penalties caused by MPN from the carrier lifetime and the spectral width is in good agreement with the measured system penalties.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
