Effect of the growth conditions on the anisotropy, domain structures and the relaxation in Co thin films

Abstract

We report a systematic study on the anisotropy symmetry, magnetic domains and magnetic relaxation behavior in Co thin films deposited on MgO (001) substrate by varying (i) the pre-annealing condition and (ii) the speed of substrate rotation during deposition. Substrate annealing prior to deposition leads to the formation of textured thin films. On contrary Co films prepared without substrate pre-annealing exhibit polycrystalline nature. Surface topography imaged by atomic force microscopy (AFM) depicts a profound effect of growth condition on grain size and its distribution. Magnetic hysteresis measurement along with simultaneous domain imaging has been performed by magneto optic Kerr effect (MOKE) based microscope by varying the angle (ϕ) between the easy axis and the direction of applied magnetic field. We observed the existence of cubic and uniaxial anisotropy due to the presence of substrate annealing and oblique angular deposition, respectively. Along the easy axis, magnetization reversal is governed by 180° domain wall motion via branched domains. However, for easy axis<ϕ<hard axis ripple domains appear in addition to branched domains during the reversal process. We observed that the magnetic relaxation behavior under constant magnetic field strongly depends on the size and distribution of the grains.