Abstract
IN a recent letter in NATURE1, Prof. E. A. Owen and Mr. R. W. Williams have given results for the effect of temperature on the intensity of X-ray reflections from copper. They find that throughout the range of temperature from 290° to 840° A., the decline of intensity with temperature is greater than predicted by the usual Debye-Waller formula, exp.—2M, where M has the well-known expression involving the characteristic temperature ⊝ which occurs in the Debye theory of specific heats, and that their results agree closely with a temperature factor of the form exp.—3M.
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