Abstract
Single crystals of Ca2La8(SiO4)6O2 have been irradiated with different ions/energies in an in-situ study of the effects of temperature and recoil-energy spectra on irradiation-induced amorphization. The dose for complete amorphization (∼ 0.36 dpa) is independent of recoil-energy spectra at 15 K and increases with temperature in two stages. The low-temperature stage (below ∼ 200 K) has an activation energy of 0.01 ± 0.003 eV and may be associated with simultaneous close-pair recombination. The high-temperature stage (above ∼ 200 K) has an activation energy of 0.13 ± 0.02 eV and may be associated with irradiation-enhanced defect mobility. The critical temperature for amorphization increases from ∼ 360 K for 0.8 MeV Ne+ to ∼ 710 K for 1.5 MeV Kr+. The amorphization dose increases more rapidly with temperature for Ne+ due to the larger fraction of recoverable defects produced by the low energy recoils.
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