Abstract
Rhodium thin films on highly polished stainless steel substrates were fabricated via pulsed laser deposition (PLD) technique. The PLD films of rhodium were observed to be preferentially oriented in Rh(111) plane. The films showed dense columnar structure of nanometric crystallites. The effects of target–substrate distance onto the root mean square roughness, crystal structure, reflectivity and thickness of the PLD rhodium films were investigated.
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