Abstract
Considerable efforts are currently being devoted to investigation of metal-organic, organic-organic and organic-inorganic interfaces relevant to organic electronic devices such as organic light emitting diode (OLEDs), organic photovoltaic solar cells, organic field effect transistors (OFETs), organic spintronic devices and organic-based Write Once Read Many times (WORM) memory devices on both rigid and flexible substrates in laboratories around the world. The multilayer structure of these devices makes interfaces between dissimilar materials in contact and plays a prominent role in charge transport and injection efficiency which inevitably affect device performance. This paper presents results of an initial study on how switching between voltage thresholds and chemical surface treatment affects adhesion properties of a metal-organic (Au-PEDOT:PSS) contact interface in a WORM device. Contact and Tapping-mode Atomic Force Microscopy (AFM) gave surface topography, phase imaging and interface adhesion properties in addition to SEM/EDX imaging which showed that surface treatment, switching and surface roughness all appeared to be key factors in increasing interface adhesion with implications for increased device performance.
Highlights
The investigation of interfaces between dissimilar organic-metal, organic-organic and organic-inorganic materials which are inherent in the devices made from them has been intensified in recent times
The interface phenomena are crucial towards the development, understanding and improvement of organic-based semiconductor electronic device [1,2,3,4,5,6,7,8,9,10,11,12,13,14] applications such as organic light emitting devices (OLEDs) [15,16,17,18], organic photovoltaic devices [19,20,21], organic thin film transistor devices [22,23,24,25,26,27] and organic spin electronic devices in which the transport and control of spin polarized information are represented [28,29,30]
Investigations of the chemical nature of interfaces are common in thin film characterization, but not much attention has been directed at measuring physical interaction until recently when advanced characterization tools are becoming more widely available
Summary
The investigation of interfaces between dissimilar organic-metal, organic-organic and organic-inorganic materials which are inherent in the devices made from them has been intensified in recent times. Investigations of the chemical nature of interfaces are common in thin film characterization, but not much attention has been directed at measuring physical interaction until recently when advanced characterization tools are becoming more widely available. The pull-off forces and surface parameters were measured and incorporated into theo-
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