Abstract
Surface segregation of various impurities such as Mg, Si, Ca, Al and Cr were determined for the haematite phase (Fe2O3) annealed in two different gas compositions involving (1) air at 1173 K, and (2) a gas mixture containing sulphur at 773 K. The objective of work was to establish the effect of the gas-phase composition on segregation of lattice defects. The near-surface segregation profiles of the impurities were determined by secondary ion mass spectrometry. The depth profile analysis was made by sputtering using an Ar+ primary beam of energy 30 keV. The surface charge was neutralized by an electron gun. It was found that annealing Fe2O3 under a gas phase containing sulphur resulted in the formation of an Fe(SO4)3 surface layer. It was observed that the two surface treatment procedures applied (both with and without sulphur) result in Mg enrichment in the near-surface region of Fe2O3. Si and Ca exhibit an enrichment and impoverishment after the surface treatments 1 and 2, respectively. Finally, the near-surface layer is impoverished in Cr and Al after both types of surface treatment. Experimental results are discussed in terms of segregation driving forces of the respective elements and the possible effect of sulphur on the gas-solid heterogeneous kinetics.
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