Abstract
Abstract Thin polysulfone (PSF) coatings on pretreated aluminum surfaces were characterized utilizing dielectric thermal analysis (DETA) to detect changes in the molecular motions and structural transitions in the PSF-Al interphase. The XPS results show that the interfacial chemistry between the PSF and the Al oxide surface was the same on both degreased and phosphoric acid anodized (PAA) Al surfaces. The order of the loss peak temperature of the PSF is, PSF coating on porous Al>PSF coating on smooth Al>neat PSF film. The activation energy of relaxation is also lower for neat PSF when compared with the thin film cast onto a smooth Al or a porous PAA Al substrate. The SEM photomicrographs revealed that the PSF uniformly coated the degreased substrate, whereas PSF filled the porous oxide on PAA Al surface and resulted in whisker-like structures.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
