Abstract
In this work, the effects of substrate texture on thin film disk noise have been studied, via recording spectral analysis. Both the total texture noise power and spectral shape were found to be dependent upon not only the texture, but also the recording density. An analytical expression for the texture noise spectrum was derived by relating texture noise to the disk surface topography. It was found that the texture noise can be characterized by the texture roughness /spl sigma//sub p/ and the down-track correlation length I. The values of l and /spl sigma//sub p/ were determined by fitting the theoretical expression with the measured spectrum. AFM measurements were also performed to examine the surface structure of the textured disk. The results agree with that of the recording spectral analysis.
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