Abstract
Transparent conducting non‐doped zinc oxide (ZnO) thin films have been deposited by the spray pyrolysis method at different substrate temperatures. X‐ray diffraction spectra of the films have shown that the films are polycrystalline and hexagonal wurtzite in structure. From these spectra, grain size and texture coefficient (TC) are calculated. The analytical method for calculating lattice constants is used to calculate a and c for the films. The preferred orientation of non‐doped ZnO thin films was changed with substrate temperature. The average optical transmittance of non‐doped ZnO thin films was over 80% in the visible range. The optical band gap and optical constants of the non‐doped ZnO thin films were evaluated as dependent on the substrate temperatures. The substrate temperature have a significant effect on structural and optical properties of the non‐doped ZnO thin films..
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