Abstract
Pure Sn films deposited on Cu and Cu alloys are prone to spontaneous whisker formation. One way of preventing whisker formation is to alloy Pb into Sn coatings. However, restriction on the use of Pb demands the development of alternative methods for preventing whisker growth. The present work reports the effect of substrate composition on whisker formation and morphology. Despite employing identical plating conditions, long filament-like whiskers grew only on Sn-plated Cu samples and not on brass. The presence or lack of Sn whiskers has been explained via the thermodynamic stability of various intermetallic compounds at the Sn/substrate interface.
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