Abstract
Post-growth manipulation of the internal electric field in CdZnTe crystals using sub-bandgap illumination is measured as a function of temperature through infrared (IR) transmission measurements. Using near sub-bandgap IR illumination, both the optical de-trapping of charge carriers and the reduction in carrier recombination increased the mobility lifetime in the crystal. The increased carrier transport is a direct result of decreased hole and electron trapping in addition to other underlying mechanisms. Concentration of the electric field near the cathode is also observed. We measured the electric field distribution with sub-bandgap illumination as a function of temperature via the Pockels effect.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
