Abstract
In giant magneto-resistive (GMR) heads used for hard disk-drives, residual stress is caused by thin film processing, and thermal stress due to heat dissipation of the GMR elements. When the difference in in-plane principal stresses in the GMR elements is large, the output voltage of the GMR heads changes and thus the read/write characteristic of hard disk-drives may be deteriorated. We have analyzed the stress in a GMR head by a finite element method with three-step zooming models. Then, we calculated the effect of this stress on magnetic performance of the GMR head. It was found that an intrinsic stress in the protective layer must be optimized and temperature increase of a GMR element must be decreased during operation to decrease the effect of the stress on magnetic performance.
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