Abstract
A detailed study of the correlation between the superconducting critical temperature and the strain in as-grown, high-quality, c-axis epitaxial, Nd-doped YBa 2 Cu 3 O 7 - Φ (YBCO) films is reported. Samples with thicknessesranging from 8 to 250 unit cells have been deposited by high-pressure oxygen sputtering on LaAlO 3 (100) single-crystal substrates. The a, b, and c axis of the films have been accurately determined by x-ray diffraction from the measurements of the (005) and the (038)-(308) reflections. Below a certain thickness, a crossover from orthorhombic to tetragonal structure is observed, together with a decrease of the critical temperature. These results cannot be explained by the elastic deformation of the film, but point to inelastic strain induced by the large mismatch with the substrate related to an oxygen reorganization in the Cu(1)-O plane.
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