Abstract
The growth mechanism and structure of strained ultra-thin Cu films on Pd(110) have been studied by LEED. AES and X-ray photoelectron polar intensity plots (PIPs) combined with single-scattering cluster modelling. The first Cu monolayer grows largely two-dimensionally and pseudomorphic with the underlying Pd(110) substrate with an in-plane lattice expansion of 7.2%. Upon completion of the first atomic layer, growth proceeds in the form of (110)-oriented clusters of large base-to-height ratio. Polar intensity plots utilising emission from the Cu2p 3 2 core level in the [001] azimuth combined with curved wave single-scattering cluster calculations demonstrate that the films adopt an fcc stacking sequence. The possibility of a strain-induced tetragonal distortion of the fcc Cu lattice is examined. The strain-induced (1 × 1) → (1 × 2) missing-row surface-phase transformation predicted by Guillopé and Legrand [Surf. Sci. 215 (1989) 577] is not observed for any film thickness in the range 1–20 eML.
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