Abstract
Thermo-Raman and dielectric constant measurements were carried out on the samples Ba(SnxTi1-x)O3, <x<0.12 simultaneously by coupling a Raman spectrometer with an LCR meter. The differential thermo-Raman intensity (DTRI) thermogram obtained from the Raman intensity revealed a range of temperature for the tetragonal to cubic phase transformation. The phase transformation temperature Tp obtained from the DTRI thermogram was found to be equal to the ferroelectric transformation temperature Tm, obtained from the maximum of the dielectric constant. Both Tp and Tm decreased almost linearly with increasing Sn concentrations. The Curie temperature Tc, Curie–Weiss constant Cw, Curie–Weiss-like constant C ′ and the critical exponent γ obtained from the analysis of dielectric constant data clearly suggest that the ferroelectric to paraelectric phase transformation undergoes a crossover from sharp to diffuse phase transformation for Sn concentrations in the range from 0.05 to 0.1. © 2001 Kluwer Academic Publishers
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