Abstract
During the last fifteen years, a new method for investigating the magnetic properties of multilayer structures—Xray resonant magnetic scattering (XRMS)—has been actively developed at all synchro� trons. Having the same magnetic sensitivity and ele� mental selectivity as Xray magnetic circular or linear dichroism (XMCD or XMLD), XRMS allows for the reconstruction of the features of magnetic ordering and the depth profile of the magnetic moments of res� onant atoms in multilayer nanofilms (see, e.g., (1-5)). This information is very important for testing and cre� ating spintronic devices. Another problem that can be solved with XRMS is the experimental determination of the refraction of waves in the medium, i.e., the absolute values of Xray susceptibility, including magnetic corrections near the absorption edges. This information is almost absent in the existing databases for the scattering amplitudes and refractive indices of various materials. The prob� lem of the determination of the optical constants for X rays near the absorption edges is of fundamental interest for the theory of solids. Furthermore, this information is necessary for processing experimental spectra and angular dependences of XRMS in order to obtain depthselective information on the magnetic structure.
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